By Topic

Fractional Order Modeling of a PHWR Under Step-Back Condition and Control of Its Global Power With a Robust {\rm PI}^{\lambda } {\rm D} ^{\mu} Controller

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Das, S. ; Sch. of Nucl. Studies & Applic., Jadavpur Univ., Kolkata, India ; Das, S. ; Gupta, A.

Bulk reduction of reactor power within a small finite time interval under abnormal conditions is referred to as step-back. In this paper, a 500 MWe Canadian Deuterium Uranium (CANDU) type Pressurized Heavy Water Reactor (PHWR) is modeled using few variants of Least Square Estimator (LSE) from practical test data under a control rod drop scenario in order to design a control system to achieve a dead-beat response during a stepped reduction of its global power. A new fractional order (FO) model reduction technique is attempted which increases the parametric robustness of the control loop due to lesser modeling error and ensures iso-damped closed loop response with a PIλDμ or FOPID controller. Such a controller can, therefore, be used to achieve active step-back under varying load conditions for which the system dynamics change significantly. For closed loop active control of the reduced FO reactor models, the PIλDμ controller is shown to perform better than the classical integer order PID controllers and present operating Reactor Regulating System (RRS) due to its robustness against shift in system parameters.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 5 )