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Effect of electron diffusion on m=2 tearing mode

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1 Author(s)
Prasad, P.V.S.R. ; Dept. of Phys., Indian Inst. of Technol., New Delhi, India

The effect of electron diffusion due to background drift wave turbulence on the stability of the m=2 tearing mode, in the collisionless and the semicollisional regimes, has been studied. The coherent direct interaction approximation has been applied to the drift-kinetic equation to obtain the renormalized tearing mode equation in the turbulent background. It has been found from the present calculations that, in the collisionless regime, the electron diffusion does not affect the stability of the mode significantly, but in the semicollisional regime, it significantly stabilizes the mode

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Plasma Science, IEEE Transactions on  (Volume:25 ,  Issue: 2 )