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A Low-Noise High Intrascene Dynamic Range CMOS Image Sensor With a 13 to 19b Variable-Resolution Column-Parallel Folding-Integration/Cyclic ADC

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9 Author(s)
Min-Woong Seo ; Research Institute of Electronics, Shizuoka University, Hamamatsu, Japan ; Sung-Ho Suh ; Tetsuya Iida ; Taishi Takasawa
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A low temporal noise and high dynamic range CMOS image sensor is developed. A 1Mpixel CMOS image sensor with column-parallel folding-integration and cyclic ADCs has 80μVrms (1.2e-) temporal noise, 82 dB dynamic range using 64 samplings in the folding-integration ADC mode. Very high variable gray-scale resolution of 13b through 19b is attained by changing the number of samplings of pixel outputs. The implemented CMOS image sensor using a 0.18-μm technology has the sensitivity of 10-V/lx·s, the conversion gain of 67- μV/e-, and linear digital code range of more than 4 decades.

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IEEE Journal of Solid-State Circuits  (Volume:47 ,  Issue: 1 )