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Color Local Texture Features for Color Face Recognition

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3 Author(s)
Jae Young Choi ; Multimedia Laboratory, Department of Electrical and Computer Engineering, University of Toronto, Toronto, Canada ; Yong Man Ro ; Konstantinos N. Plataniotis

This paper proposes new color local texture features, i.e., color local Gabor wavelets (CLGWs) and color local binary pattern (CLBP), for the purpose of face recognition (FR). The proposed color local texture features are able to exploit the discriminative information derived from spatiochromatic texture patterns of different spectral channels within a certain local face region. Furthermore, in order to maximize a complementary effect taken by using both color and texture information, the opponent color texture features that capture the texture patterns of spatial interactions between spectral channels are also incorporated into the generation of CLGW and CLBP. In addition, to perform the final classification, multiple color local texture features (each corresponding to the associated color band) are combined within a feature-level fusion framework. Extensive and comparative experiments have been conducted to evaluate our color local texture features for FR on five public face databases, i.e., CMU-PIE, Color FERET, XM2VTSDB, SCface, and FRGC 2.0. Experimental results show that FR approaches using color local texture features impressively yield better recognition rates than FR approaches using only color or texture information. Particularly, compared with grayscale texture features, the proposed color local texture features are able to provide excellent recognition rates for face images taken under severe variation in illumination, as well as for small- (low-) resolution face images. In addition, the feasibility of our color local texture features has been successfully demonstrated by making comparisons with other state-of-the-art color FR methods.

Published in:

IEEE Transactions on Image Processing  (Volume:21 ,  Issue: 3 )
IEEE Biometrics Compendium
IEEE RFIC Virtual Journal
IEEE RFID Virtual Journal