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Chances and limits of a thermal control for a three-phase voltage source inverter in traction applications using permanent magnet synchronous or induction machines

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2 Author(s)
Weckert, M. ; Inst. of Power Electron. & Electr. Drives, Univ. of Stuttgart, Stuttgart, Germany ; Roth-Stielow, J.

The lifetime of power semiconductor devices strongly depends on their mission profile. The main influence limiting the lifetime are thermal cycles causing thermo-mechanical stress. Using the example of a three-phase voltage source inverter (VSI) feeding an induction (IM) or a permanent magnet synchronous machine (PMSM), this paper will present a thermal control strategy to increase the lifetime of the power semiconductors within the VSI. Especially within traction applications, the occurring operation points are very unsteady and rarely predictable. Therefore a thermal control is designed to dynamically react on changing operation points. The performance of the proposed thermal control using both machine types is proved at a real setup for load cycles similar to traction applications. By measuring the junction temperatures of the power semiconductors, a lifetime estimation is done to compare the different control strategies.

Published in:

Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on

Date of Conference:

Aug. 30 2011-Sept. 1 2011