IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Fuzzy Systems and Knowledge D ... Help

A comparison of two numerical methods for tem response of conductive plate

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Qing-xin Meng ; Inst. of Geophys. & Geomatics, China Univ. of Geosci., Wuhan, China ; Heping Pan

This paper describes two numerical methods (eddy current circuit method, double line current method) for transient electromagnetic method response of conductive thin plate. We simulate TEM abnormal response of different conductive plates by using these methods in coincident-loop configuration and make an analysis abut these numerical principles by contrasting characteristics of the mathematical models.

Published in:
Fuzzy Systems and Knowledge Discovery (FSKD), 2011 Eighth International Conference on  (Volume:4 )

Date of Conference: 26-28 July 2011

Page(s):
2447 - 2450
Print ISBN:
978-1-61284-180-9
INSPEC Accession Number:
12244528
Conference Location :
Shanghai
Digital Object Identifier :
10.1109/FSKD.2011.6019972
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.