Cart (Loading....) | Create Account
Close category search window
 

Statistical Edge Detection in Urban Areas Exploiting SAR Complex Data

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Baselice, F. ; Centro Direzionale di Napoli, Univ. degli Studi di Napoli Parthenope, Naples, Italy ; Ferraioli, G.

The aim of building edge detection is to obtain a map of man-made structure edges of the investigated scene. Different detectors have been developed exploiting synthetic aperture radar (SAR) data, based on the use of the reflectivity difference (working with SAR amplitude images) or of the phase difference (working with SAR interferometric images) between neighboring pixels. In this letter, a novel approach using jointly both the amplitudes and the interferometric phase of two complex SAR images is proposed, based on the hypothesis that information related to building edges can be retrieved in the two data domains. The technique is based on stochastic estimation theory, exploiting, in particular, Markov random fields. Compared to classical amplitude-based edge detectors and to phase-based ones, the proposed method shows an improvement in terms of detection accuracy, false alarm rate, and building shape recovery. The algorithm has been tested and analyzed using simulated data and validated on L-band and X-band real data sets.

Published in:

Geoscience and Remote Sensing Letters, IEEE  (Volume:9 ,  Issue: 2 )

Date of Publication:

March 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.