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Functional Test-Sequence Grading at Register-Transfer Level

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5 Author(s)
Hongxia Fang ; Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA ; Chakrabarty, K. ; Jas, A. ; Patil, S.
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We propose output deviations as a surrogate metric to grade functional test sequences at the register-transfer level without explicit fault simulation. Experimental results for the open-source Biquad filter core and the Scheduler module of the Illinois Verilog Model show that the deviations metric is computationally efficient and it correlates well with gate-level coverage for stuck-at, transition-delay and bridging faults. Results also show that functional test sequences reordered based on output deviations provide steeper gate-level fault coverage ramp-up compared to other ordering methods.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:20 ,  Issue: 10 )

Date of Publication:

Oct. 2012

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