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(Pb-Sn-Ti)O3 (PST) thin films are fabricated by the pulse laser deposition method with three ceramic targets of PbO, SnO and TiO2 with consecutive sequences of deposition. Lattice parameters of PST thin film are a=b=0.3993 nm, c=0.4048 nm. This fact together with TEM-EDX results suggests that PST films are the mixed state of PbTiO3-SnTiO3-PbSnO3. Real part of dielectric constant and remanent polarization are determined to be about 1000 and 35 μC/cm2 at room temperature, respectively. X-ray diffraction reveals that a structural phase transition takes place at 600 °C. Piezoelectric response is confirmed by a piezo-force scanning microscope.