IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Applications of Ferroelectric ... Help

Variation of di-/piezoelectric properties of PIN-PMN-PT crystals near morphotropic phase boundary along the growth direction

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wang, Linghang ; Electron. Mater. Res. Lab., Xi''an Jiaotong Univ., Xi''an, China ; Xu, Zhuo ; Li, Zhenrong ; Wan, Yuhui
more authors

25Pb(In1/2Nb1/2)O3-45Pb(Mg1/3Nb2/3)O3 -30PbTiO3 (PIN-PMN-PT) ingots with the dimensions of Ø55×130mm were successfully grown by vertical Bridgman technique. The as-grown PIN-PMN-PT crystals were oriented and characterized on (001) cuts. Variation of di-/piezoelectric properties of the as-grown PIN-PMN-PT crystals near morphotropic phase boundary (MPB) along the growth direction were investigated. Temperature dependence of dielectric permittivity advised 60~135°C of rhombohedral to tetragonal phase transition temperature (Trt) and 120~210°C of Curie temperature (Tc) near MPB along the growth direction. PIN-PMN-PT crystals have coercive fields (Ec) of about 4.35kV/cm, more than twice that of Pb(Mg1/3Nb2/3)O3-32PbTiO3 (PMN-PT) and about 1% electric field strain. Tc was found to increase linearly along the growth direction and Trt gradually decreased in the middle part of the ingot. The piezoelectric constant, d33, increased initially then kept around 2000pC/N at lower but near MPB and the dielectric constant, εr, had the same trend with d33 falling into the scope of 5000-6300.

Published in:
Applications of Ferroelectrics (ISAF/PFM), 2011 International Symposium on and 2011 International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials

Date of Conference: 24-27 July 2011

Page(s):
1 - 4
E-ISBN :
978-1-4577-1161-9
Print ISBN:
978-1-4577-1162-6
INSPEC Accession Number:
12228089
Conference Location :
Vancouver, BC
Digital Object Identifier :
10.1109/ISAF.2011.6014146
Product Type:
Conference Publications

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.