Close category search window
 

Face recognition using survival exponential entropy: Based on Markov Random Field modeling

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bao Jin ; Sch. of Electron. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China ; Xie Mei

In this paper, a new method for face recognition is proposed based on Markov Random Fields (MRF) modeling. Constrains on image features as well as contextual relationships between them are explored and encoded into a cost function derived based on a statistical model of MRF. The face images are divided into salient regions, and the MRF model is used to represent the relationship between the regions and region ID's. We use a new salient region detector based on the survival exponential entropy (SEE), the survival exponential entropy based normalized mutual information is proposed and integrated with the MRF model as the similarity measure to reflect the similarity between two facial images. The proposed method is evaluated and compared with several state-of-the-art face recognition methods, experiments demonstrate promising results.

Published in:
Communication Software and Networks (ICCSN), 2011 IEEE 3rd International Conference on

Date of Conference: 27-29 May 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.