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Test pattern generation for combinatorial multi-valued networks based on generalized D-algorithm

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3 Author(s)
Shmerko, V.P. ; Inst. of Comput. Sci. & Inf. Syst., Tech. Univ. Szczecin, Poland ; Yanushkevich, S.N. ; Levashenko, V.

A calculus for test pattern generation for Multi-Valued Logic (MVL) networks using so-called Direct D-cubes (DD-cubes) is proposed. The concept of the DD-cubes is introduced based on Direct Logic Derivatives generated by a matrix algorithm. It provides a means to support the central stages of test generating on parallel hardware, for instance, linear systolic arrays

Published in:

Multiple-Valued Logic, 1997. Proceedings., 1997 27th International Symposium on

Date of Conference:

28-30 May 1997