By Topic

Efficiency droop in InGaN/GaN multiple-quantum-well blue light-emitting diodes grown on free-standing GaN substrate

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

10 Author(s)

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3605572 

In this work, the dislocation-related efficiency droop in InGaN/GaN blue light-emitting diodes (LEDs) was investigated by comparing the external quantum efficiency (EQE) of GaN grown on c-plane sapphire and free-standing GaN substrate over a wide range of operation conditions. The values of A, B, and C coefficients had been iteratively obtained by fitting quantum efficiency in the rate equation model. Analysis revealed that threading dislocation density was strongly related to the decrease in EQE of InGaN LEDs at elevated currents by introducing a number of acceptor-like levels with the energy EA lying within the band gap.

Published in:

Applied Physics Letters  (Volume:99 ,  Issue: 9 )