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The nondestructive measurement of the charge-to-mass ratio of an insulating tone layer present on a photoconductor

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1 Author(s)
Fowlkes, W.Y. ; Eastman Kodak Co., Rochester, NY, USA

Nondestructively measuring the charge present in a toner layer based upon a noncontacting measurement of the potential across the layer and the solution of Poisson's equation for the toner layer is addressed. The former is easily accomplished using commercially available electrostatic voltmeters. The latter requires detailed knowledge of the toner layer morphology. Solid-area continuous-tone images of various densities have been studied microscopically to determine toner stack height and volume-mass density. From these data, the toner charge-to-mass ratio is determined. An adjustment of the data for stack height to account for the surface-layer topology (roughness) yields a final accuracy of about 6%

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Industry Applications, IEEE Transactions on  (Volume:26 ,  Issue: 5 )