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Integrating on-chip temperature sensors into DfT schemes and BIST architectures

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3 Author(s)
Szekely, V. ; Dept. of Electron Devices, Tech. Univ. Budapest, Hungary ; Rencz, M. ; Courtois, B.

The continuously increasing power densities in integrated circuits necessitated the introduction of DfTT (Design for Thermal Testability) design methodology to prevent overheating effects. Newly developed CMOS temperature sensors enable the application of DfTT principle in safety-critical circuits. Parameters and operation principles of the low-power small-area temperature sensor family are presented in details in the paper, followed by the discussion of placement and testing strategies

Published in:

VLSI Test Symposium, 1997., 15th IEEE

Date of Conference:

27 Apr-1 May 1997

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