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On optimizing BIST-architecture by using OBDD-based approaches and genetic algorithms

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4 Author(s)
Okmen, C. ; Inst. of Comput. Sci., Albert-Ludwigs-Univ., Freiburg, Germany ; Keirn, M. ; Krieger, R. ; Becker, B.

We introduce a two-staged Genetic Algorithm for optimizing weighted random pattern testing in a Built-in-Self-Test (BIST) environment. The first stage includes the OBDD-based optimization of input probabilities with regard to the expected test length. The optimization itself is constrained to discrete weight values which can directly be integrated in a BIST environment. During the second stage, the hardware-design of the actual BIST-structure is optimized. Experimental results are given to demonstrate the quality of our approach

Published in:

VLSI Test Symposium, 1997., 15th IEEE

Date of Conference:

27 Apr-1 May 1997