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Scattering parameters of E-plane printed opposite fin in waveguide

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2 Author(s)
Ho, T.Q. ; Hughes Aircraft Co., Los Angeles, CA, USA ; Shih, Y.C.

An analysis of the E-plane printed opposite fin in a waveguide is presented. The current distribution existing on the metal fin is obtained through a variational technique that utilizes the extremization process. The eigenvalue functions derived from the transverse resonance condition are used to include the effects of the dielectric layer. The computed data for a simplified case with Duroid substrate are compared with those obtained by means of the spectral-domain method. Based on the calculated results, a band-reject filter has been designed and tested at Ka-band. Good agreement on the filter response has been observed between theory and measurement

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:38 ,  Issue: 11 )

Date of Publication:

Nov 1990

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