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Research and design of data acquisition system in TD-LTE Wireless Integrated Testing Platform

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3 Author(s)
Fatang Chen ; Chongqing Key Lab. of Mobile Commun., Chongqing Univ. of Posts & Telecommun. (CQUPT), Chongqing, China ; Jian Ye ; Linqi Sun

Based on TD-LTE (TD-SCDMA Long Term Evolution) Integrated Testing Platform, data acquisition need to be completed between DSP and FPGA, a realizing scheme of downlink link processing in system is proposed, with which complete the design and verification of the McBSP (Multichannel Buffered Serial Port) interface in the FPGA chip of series Virtex 5. The scheme has been used in TD-LTE wireless integrated testing instruments to complete large-capacity uplink data acquisition, meet the requirements of TD-LTE test in terms of processing speed and data accuracy.

Published in:

Multimedia Technology (ICMT), 2011 International Conference on

Date of Conference:

26-28 July 2011