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Non-scan design for testable data paths using thru operation

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4 Author(s)
K. Takabatake ; Hokuriku Multimedia Service Promotion Headquarter, NTT, Kanazawa, Japan ; T. Masuzawa ; M. Inoue ; H. Fujiwara

We present a new non-scan DFT technique for register-transfer (RT) level data paths. In the technique, we add thru operations to some operational modules to make the data path easily testable. We define a testable measure, weak testability, and consider the problem to make the data path weakly testable with minimum hardware overhead. We also define a measure to estimate the test generation time. Experimental results show the effectiveness of our technique and the proposed measure

Published in:

Design Automation Conference, 1997. Proceedings of the ASP-DAC '97 Asia and South Pacific

Date of Conference:

28-31 Jan 1997