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Test generation for multiple state-table faults in finite-state machines

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2 Author(s)
I. Pomeranz ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; S. M. Reddy

A test generation procedure to detect multiple state-table faults in finite-state machines is proposed. The importance of multiple state-table faults and their advantages as test generation objectives to avoid the need for checking experiments are considered. The proposed procedure is based on a new method for implicit enumeration of large numbers of multiple faults by using incompletely specified faulty machines. Experimental results are presented to demonstrate the effectiveness of implicit fault enumeration in detecting large numbers of multiple faults and in guaranteeing detection of all the faults or all the faults up to a specific multiplicity

Published in:

IEEE Transactions on Computers  (Volume:46 ,  Issue: 7 )