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Charge carrier extraction dynamics for organic field effect transistor structures

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4 Author(s)
Chang, Hsiu-Chuang ; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA ; Ruden, P.Paul ; Liang, Yan ; Frisbie, C.Daniel

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We present experimental data and a model for charge carrier extraction from the channel of a device structure resembling an organic field effect transistor. The initially accumulated channel is depleted by a sudden change of the gate voltage. The measured discharge current transient decreases either as a power law or exponentially if the final state of the channel is completely or partially depleted, respectively. The extraction process is modeled with a capacitor/resistor circuit with a time-dependent resistance that increases with decreasing channel carrier density. Analytical and numerical results are discussed and compared with the experimental data.

Published in:

Applied Physics Letters  (Volume:99 ,  Issue: 7 )