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Characterization of new radiation hardened bipolar operational amplifiers

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5 Author(s)
Géraldine Chaumont ; STMicroelectronics, 3 rue de Suisse, 35200 Rennes, France ; Benoît Cornanguer ; Patrick Briand ; Christophe Prugne
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New operational amplifiers have been ELDRS and heavy ions characterized. This paper presents the TID results at high and low dose rate and SEE tests results.

Published in:

Radiation and Its Effects on Components and Systems (RADECS), 2009 European Conference on

Date of Conference:

14-18 Sept. 2009