Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Low-frequency noise in ZnO varistor structures

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Hasse, L. ; Dept. of Optoelectron. & Electron. Syst., Gdansk Univ. of Technol., Gdansk, Poland ; Smulko, J. ; Kaczmarek, L.

The noise spectroscopy has been used as a diagnostic tool of surge arrester varistor structures consisting of grained ZnO. The electrical properties of measured samples have been described. In the experimental study, the applied measurement system and the results of noise measurements for the selected structures of 280 V and 440 V varistors have been presented. Noise properties are related to electrical characteristics of measured specimens. It is suggested that the proposed procedure can be applied as an effective nondestructive testing method focused on defects and structural inhomogeneity detection in tested objects.

Published in:

Noise and Fluctuations (ICNF), 2011 21st International Conference on

Date of Conference:

12-16 June 2011