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Noise and diffusion of hot carriers in semiconductor materials and devices

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2 Author(s)
Nougier, J.P. ; IES, Univ. Montpellier 2, Montpellier, France ; Varani, L.

Hot carrier transport and noise get an increasing importance due to down scaling dimensions of microelectronic devices. A survey is given of the significant evolution and progress made during the last 40 years in this domain. A focus is made on diffusion noise : definition of the noise sources, experimental determination, microscopic modeling, noise in devices.

Published in:

Noise and Fluctuations (ICNF), 2011 21st International Conference on

Date of Conference:

12-16 June 2011

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