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An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

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4 Author(s)
L. Sterpone ; Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy ; N. Battezzati ; F. Lima Kastensmidt ; Raul Chipana

A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.

Published in:

IEEE Transactions on Nuclear Science  (Volume:58 ,  Issue: 5 )