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An Analytical Model of the Propagation Induced Pulse Broadening (PIPB) Effects on Single Event Transient in Flash-Based FPGAs

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4 Author(s)
Sterpone, L. ; Dipt. di Autom. e Inf., Politec. di Torino, Torino, Italy ; Battezzati, N. ; Kastensmidt, F.L. ; Chipana, R.

A methodology for characterization of Propagation Induced Pulse Broadening (PIPB) effects concerning the Single Event Transients (SETs) propagation within logic and routing resources of Flash-based Field Programmable Gate Arrays (FPGAs) is presented. Electrical-based fault injection was performed on the FPGA board and at the electrical model. Experimental results matched the electrical simulations, which validate the effectiveness of the method.

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Nuclear Science, IEEE Transactions on  (Volume:58 ,  Issue: 5 )