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The power dissipation during the application of scan-based tests can be significantly higher than during functional operation. An exception is the second, fast functional capture cycles of functional broadside tests, where it is guaranteed that the power dissipation will not exceed that possible during functional operation. The power dissipation during the other clock cycles of functional broadside tests is studied here for the first time. The clock cycles under consideration are referred to as scan shift cycles. This paper describes a test generation procedure that limits the power dissipation during scan shift cycles of functional broadside tests. Experimental results for benchmark circuits demonstrate the extent to which the power dissipation during scan shift cycles can be limited without affecting the transition fault coverage.