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A design of mixed-signal test controller based on boundary scan

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4 Author(s)
Shengjian Chen ; Dept. of Control Eng., Acad. of Armored Force Eng., Beijing, China ; Mengmeng Wang ; Lei Xu ; Yin Zhou

With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method - boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly. The design of the boundary scan controller provides a basis for the further research of mixed electronic system BIT.

Published in:

Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on

Date of Conference:

15-17 July 2011