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With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method - boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly. The design of the boundary scan controller provides a basis for the further research of mixed electronic system BIT.
Date of Conference: 15-17 July 2011