Referenced Items are not available for this document.
With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method - boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly. The design of the boundary scan controller provides a basis for the further research of mixed electronic system BIT.
Published in:
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Date of Conference: 15-17 July 2011
- Page(s):
- 940 - 943
- Print ISBN:
- 978-1-4244-9436-1
- INSPEC Accession Number:
- 12242868
- Conference Location :
- Hohhot
- Digital Object Identifier :
- 10.1109/MACE.2011.5987086
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
