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Thermionic electron emission microscopy of metal-oxide multilayers on tungsten

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4 Author(s)
Vaughn, J.M. ; Department of Physics and Astronomy, Ohio University, Athens, OH, USA ; Congshang Wan ; Jamison, K.D. ; Kordesch, M.E.

Thick (200-nm) layers of reactively sputtered BaO and Sc _{2} O _{3} on tungsten foil are imaged with thermionic electron emission microscopy (ThEEM). The scandia films are observed to show what we have named the “window effect,” i.e., apparent electron transparency in the ThEEM image, showing the underlying structure of the polycrystalline W foil.

Note: The Institute of Electrical and Electronics Engineers, Incorporated is distributing this Article with permission of the International Business Machines Corporation (IBM) who is the exclusive owner. The recipient of this Article may not assign, sublicense, lease, rent or otherwise transfer, reproduce, prepare derivative works, publicly display or perform, or distribute the Article.  

Published in:

IBM Journal of Research and Development  (Volume:55 ,  Issue: 4 )