Thick (200-nm) layers of reactively sputtered BaO and Sc O on tungsten foil are imaged with thermionic electron emission microscopy (ThEEM). The scandia films are observed to show what we have named the “window effect,” i.e., apparent electron transparency in the ThEEM image, showing the underlying structure of the polycrystalline W foil.
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IBM Journal of Research and Development
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18 August 2011
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