By Topic

Contribution of the easy axis orientation, anisotropy distribution and dot size on the switching field distribution of bit patterned media

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Jehyun Lee ; Institute of Solid State Physics, Vienna University of Technology, Wiener Hauptstrasse 8-10, 1040 Vienna, Austria ; Brombacher, Christoph ; Fidler, J. ; Dymerska, Barbara
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A magnetic nanostructure array was fabricated by post-patterning of a L10 ordered 5-nm-thick FePtCu film revealing a rather broad switching field distribution (SFD). The individual contributions to the SFD of the dot array were investigated by micromagnetic simulations. Based on transmission electron microscopy results, the dots show a truncated cone shape which was directly used for the finite element model. The influence of single parameters, i.e., easy axis distribution, magnetic anisotropy, and dot size, on the SFD was estimated quantitatively and compared. Furthermore, the influence of damage induced during the nanofabrication process was analyzed and correlated with experimental results.

Published in:

Applied Physics Letters  (Volume:99 ,  Issue: 6 )