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Unsharp Masking Sharpening Detection via Overshoot Artifacts Analysis

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4 Author(s)
Gang Cao ; Institute of Information Science, Beijing Jiaotong University, China ; Yao Zhao ; Rongrong Ni ; Alex C. Kot

In this letter, we propose a new method in detecting unsharp masking (USM) sharpening operation in digital images. Overshoot artifacts are found to occur around side-planar edges in the sharpened images. Such artifacts, measured by a sharpening detector, can serve as a rather unique feature for identifying the previous performance of sharpening operation. Test results on photograph images with regard to various sharpening operators show the effectiveness of our proposed method.

Published in:

IEEE Signal Processing Letters  (Volume:18 ,  Issue: 10 )