Cart (Loading....) | Create Account
Close category search window
 

Cyber-physical security using system-level PUFs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Al Ibrahim, O. ; SMU HACNet Labs., Southern Methodist Univ., Dallas, TX, USA ; Nair, S.

Cyber Physical Systems (CPS) is an emerging computing paradigm that is becoming prevalent in various technologies. Achieving a trustworthy CPS requires us to build mechanisms that ensure the integrity and authenticity of these systems. Fortunately with the new advancements in semi-conductor-based technologies, in particular Physical Unclonable Functions (PUFs), we have the potential to build secure couplings between cyber and physical substrates based on intrinsic physical material. In this paper, we share some thoughts on how to utilize the PUF technology for security in CPS. Based on a composition approach, we illustrate the benefits of combining multiple PUF elements, with some inherently bias factor, into one randomly secure and strong system-level PUF.

Published in:

Wireless Communications and Mobile Computing Conference (IWCMC), 2011 7th International

Date of Conference:

4-8 July 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.