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Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors

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3 Author(s)
Pedro Reviriego ; Universidad Antonio de Nebrija, C/ Pirineos 55, 28040 Madrid, Spain ; Juan Antonio Maestro ; Sanghyeon Baeg

In this paper, we propose the use of ad-hoc scrubbing sequences to improve memory reliability. The key idea is to exploit the locality of the errors caused by a Multiple Cell Upset (MCU) to make scrubbing more efficient. The starting point is the MCU distributions for a given device. A procedure is presented that uses that information to determine an ad-hoc scrubbing sequence that maximizes reliability. The approach is then applied to a case study and results show a significant increase in the Mean Time To Failure (MTTF) compared with traditional scrubbing.

Published in:

Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE

Date of Conference:

5-9 June 2011