By Topic

Soft Fault Diagnosis of Analog Circuit Using Transfer Function Coefficients

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kavithamani, A. ; Dept. of Electr. & Electron. Eng., Coimbatore Inst. of Technol., Coimbatore, India ; Manikandan, V. ; Devarajan, N.

A method to identify parametric faults occurring in analog circuits is proposed in this paper. This method uses transfer function coefficients to identify faults in analog circuits as these coefficients are sensitive to the parameters of the circuit. Using Monte Carlo simulation each parameter of the circuit is varied within its tolerance limit and the minimum and maximum values of each coefficient are found for faulty and fault free conditions. While testing the coefficients are found for the injected fault and if all coefficients are within the predetermined bound limits of any fault conditions then the circuit is confirmed to have that particular fault. In the same manner all single faults occurring in the analog circuits are identified. The proposed method is illustrated through second order sallenkey band pass filter circuit. Results have confirmed that the proposed method can diagnose single parametric faults in analog circuits efficiently.

Published in:

Process Automation, Control and Computing (PACC), 2011 International Conference on

Date of Conference:

20-22 July 2011