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Generation of Mixed Test Sets for Transition Faults

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1 Author(s)
Pomeranz, I. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA

Test sets that contain both broadside and skewed-load tests are important for achieving the highest possible delay fault coverage for standard-scan circuits. Both types of tests can be represented as 〈s1, v1, s2, v2 〉, where s1 and s2 are states, and v1 and v2 are primary input vectors. To facilitate the generation of a mixed test set that contains both broadside and skewed-load tests, this paper associates with s2 a property that can be used for estimating whether a skewed-load or a broadside test is more likely to exist with s2 in its second pattern. This paper uses this property for guiding a test generation procedure to consider only one of the two test types for most of the target faults.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:20 ,  Issue: 10 )