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Comparison of two quality control models for short run process based on Bayesian analysis

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3 Author(s)
Qinwen Huang ; Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., CEPREI Labs., Guangzhou, China ; Wenxiao Fang ; Jian Liu

In dealing with the problem of establishing control limits in short run production, Bayesian approach provides a effective way for are short run process control and are particularly attractive. In this paper, two quality control models for short run process are presented based on Bayesian analysis and the two models are compared. Models are focused on normally distributed data. The first way to establish model is through the posterior density of mean and variance of normally distributed data respectively and the second way is through the posterior predictive density. And the results deduced from two different ways are compared.

Published in:

Quality, Reliability, Risk, Maintenance, and Safety Engineering (ICQR2MSE), 2011 International Conference on

Date of Conference:

17-19 June 2011