By Topic

Real-Time Characterization of Gated-Mode Single-Photon Detectors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Ferreira da Silva, T. ; Opt. Metrol. Div., Nat. Inst. of Metrol., Stand. & Ind. Quality, Duque de Caxias, Brazil ; Xavier, G.B. ; von der Weid, J.P.

We propose a characterization method for the overall detection efficiency, afterpulse and dark count probabilities of single-photon counting modules in real-time with simple instrumentation. This method can be applied when the module is running in its intended application, and is based on monitoring the statistics of the times between consecutive detections. A mathematical model is derived and fit to the data statistical distribution to simultaneously extract the characterization parameters. The feasibility of our scheme is demonstrated by performing measurements on three commercial devices based on cooled InGaAs avalanche photodiodes operating in gated mode. Different statistical ensemble lengths were analyzed and results assess the scheme for real-time application.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:47 ,  Issue: 9 )