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Control of Bragg grating resonant wavelength through its dependence on the effective index of a waveguide

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3 Author(s)
E. M. Bradley ; Tetra Tech Data Syst., Carlsbad, CA, USA ; P. K. L. Yu ; R. F. Mathis

Fabrication tolerances for control of the Bragg wavelength of gratings in waveguides are studied. Techniques are demonstrated to hold the period of the grating constant to ±0.04 nm over the majority of the exposed wafer area, and ridge waveguides fabricated with standard thin film process equipment are found to have Bragg wavelengths constant to within ±0.2 nm. Additionally, adjacent ridges with differing widths are written in a single photomask/etch process step and found to controllably shift the Bragg wavelength over a 10-20-nm band suitable for a distributed Bragg reflector (DBR) laser array or a monolithic comb filter for wavelength division multiplexing (WDM) filtering/routing arrays

Published in:

Journal of Lightwave Technology  (Volume:15 ,  Issue: 7 )