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Polarimetric wavelet phenomenology of space materials

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5 Author(s)
Giakos, G.C. ; Dept. of Electr. & Comput. Eng., Univ. of Akron, Akron, OH, USA ; Picard, R.H. ; Dao, P.D. ; Crabtree, P.N.
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This paper describes new polarimetric wavelet detection principles applied to the backscattering characteristics of space materials in the near infrared. Efficient polarimetric detection techniques are combined with cross-correlation and wavelet analysis for enhanced characterization of space materials. The outcome of this study will support remote characterization of space materials and structures with enhanced discrimination, localization, and high-dynamic range while maintaining uncompromised sensitivity.

Published in:

Imaging Systems and Techniques (IST), 2011 IEEE International Conference on

Date of Conference:

17-18 May 2011