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Boundary reconstruction of completely conductive inclusions by Electrical resistance tomography

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3 Author(s)
Chao Tan ; Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China ; Yaoyuan Xu ; Feng Dong

Determining the boundary of inclusions within an opaque vessel sometimes is of more interest to academic research and industrial application than conductivity distribution when applying Process tomography. This work focuses on reconstructing the boundary of completely conductive inclusions by Boundary Element Method with Electrical resistance tomography (ERT). The integral equations of forward problem are reformed since they are not identical as those for low conductivity. Inverse problem is solved with Levenberg-Marquardt (L-M) Algorithm. The results are verified with numerical simulations and errors have shown acceptable.

Note: This article was mistakenly omitted from the original submission to IEEE Xplore because it was incorrectly tagged as non presented at the conference.  

Published in:

Imaging Systems and Techniques (IST), 2011 IEEE International Conference on

Date of Conference:

17-18 May 2011