Cart (Loading....) | Create Account
Close category search window

Optimal grid pattern generation for automatic 2D-3D correspondence

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Choi, K. ; Dept. of Media Technol., Sogang Univ., Seoul, South Korea ; Seo, Y.

In general, to calibrate a camera, a set of 2D-3D correspondences are needed. Because of its invariance under projective automorphisms, cross-ratio has been used to identify 2D points on a grid pattern yielding 2D-3D correspondences. However, the pixel errors in detecting grid corner points make the identification challenging. This even gets harder if the given cross-ratios are not distributed separatively enough. To build such a distribution of cross-ratios, in this work the authors have approximated the error propagation from corner point detection to cross-ratio calculation by unscented transform and optimised the distribution by particle swarm optimisation. Experimental results show that the grid patterns generated by the authors are unique enough to give automatic 2D-3D correspondences.

Published in:

Electronics Letters  (Volume:47 ,  Issue: 14 )

Date of Publication:

July 7 2011

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.