Cart (Loading....) | Create Account
Close category search window
 

Stress-Induced Eddy Currents in Magnetostrictive Energy Harvesting Devices

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Davino, D. ; Dipt. di Ing., Univ. degli Studi del Sannio, Benevento, Italy ; Giustiniani, A. ; Visone, C. ; Zamboni, W.

The paper aims to provide a more accurate analysis of a magnetostrictive energy harvesting device by proposing a FEM model which, assuming a realistic nonlinear characteristic of the material, is able to describe the harvesting phenomena in presence of the eddy currents induced by the Villari effect. The study is focused on the investigation of the influence of those parameters, such as pre-stress and bias, on the field dynamics and, consequently, on the eddy currents loss phenomena which cannot be disregarded if a reliable prediction of the global performances of these devices is required. The numerical results are computed by considering a compressive stress-driven vibration source and show spatial profiles of the fields, losses, and recovered powers in different operating conditions. Comparisons with the linear model are also provided.

Published in:

Magnetics, IEEE Transactions on  (Volume:48 ,  Issue: 1 )

Date of Publication:

Jan. 2012

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.