Close category search window
 

Abnormal switching of ferroelectric domains created by the tip of an atomic force microscope in a congruent LiTaO3 single-crystal thin film

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Brugere,, Antoine ; CEA LETI MINATEC, 17 rue des Martyrs, 38054 Grenoble Cedex, France ; Gidon,, Serge ; Gautier, B.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3607302 

Ferroelectric domains have been created in single-crystal ∼1 μm thick LiTaO3 films using the tip of an atomic force microscope. The presence of a domain with a polarization that is oriented in the opposite direction as compared to the applied field in the center of the domains created by the tip is reported. This paper aims at better understanding this phenomenon. Domains with a polarization oriented toward the bulk do not behave like domains with a polarization oriented toward the surface. The evolution of the size of the abnormal domain as a function of the parameters of the applied voltages and exerted forces is studied using a technique derived from the atomic force microscope (piezoresponse force microscopy), and its kinetics of formation is recorded by means of time resolved piezoresponse force microscopy. The possible causes for its appearance are discussed. The ferroelastic effect does not seem to play a role in the process. A possible artifact from the atomic force microscopy imaging process itself is not relevant. It appears that the most probable mechanism responsible for this phenomenon is the injection of charges during the application of the voltage pulse, which creates a strong electric field when the voltage is removed. The experimental observations are discussed in light of this hypothesis.

Published in:
Journal of Applied Physics  (Volume:110 ,  Issue: 2 )

Date of Publication: Jul 2011

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.