By Topic

Prognostics of Multilayer Ceramic Capacitors Via the Parameter Residuals

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jianzhong Sun ; Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China ; Shunfeng Cheng ; Pecht, M.

This paper presents a parameter residual-based method for predicting the remaining useful life (RUL) of multilayer ceramic capacitors (MLCCs) under temperature-humidity-bias conditions. Three performance parameters in each MLCC were monitored: capacitance, dissipation factor, and insulation resistance. A kernel regression method was used to estimate the parameters' values of interest. The residuals were generated by the difference between the estimation and the actual monitored value. Based on the features of the residual data, a linear state space model was adopted to describe the dynamics of the residuals. The future evolution of the residuals was predicted with uncertainty bounds in a Bayesian framework. The failure threshold in terms of the parameter residuals was investigated. Then, the RUL of each MLCC with uncertainty bounds was determined. By comparing the predicted results with the experimental results, it was demonstrated that the proposed prognostics approach can provide an estimation of the RUL of MLCCs.

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:12 ,  Issue: 1 )