Referenced Items are not available for this document.
The impulse response of a linear circuit element contains enough information to functionally characterize that element. A numerical technique for the comparison of observed and expected (reference) transient responses is presented. The application of this technique results in an index, which is an absolute measure of device functionality, and real-time pass/fail limits are then set by simulating functional defects in the device under test and noting the magnitude of the indices generated. Comparisons of transient response test results with the results obtained from conventional test programs are presented for D/A converters
Published in:
Defect and Fault Tolerance in VLSI Systems, 1993., The IEEE International Workshop on
Date of Conference: 27-29 Oct 1993
- Page(s):
- 295 - 302
- Meeting Date :
- 27 Oct 1993-29 Oct 1993
- ISSN :
- 1063-6722
- Print ISBN:
- 0-8186-3502-9
- INSPEC Accession Number:
- 4966283
- Conference Location :
- Venice
- Digital Object Identifier :
- 10.1109/DFTVS.1993.595825
- Product Type:
- Conference Publications
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
