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On High-Quality Test Pattern Selection and Manipulation

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3 Author(s)
Feng Yuan ; Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China ; Xiao Liu ; Qiang Xu

With a given test set, this paper is concerned about selecting a subset of test patterns and manipulating them into high-quality ones that reduce both under-testing and over-testing, which are both serious concerns for the semiconductor industry with technology scaling. Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed solution.

Published in:

2011 Sixteenth IEEE European Test Symposium

Date of Conference:

23-27 May 2011