Referenced Items are not available for this document.
With a given test set, this paper is concerned about selecting a subset of test patterns and manipulating them into high-quality ones that reduce both under-testing and over-testing, which are both serious concerns for the semiconductor industry with technology scaling. Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed solution.
Published in:
European Test Symposium (ETS), 2011 16th IEEE
Date of Conference: 23-27 May 2011
- Page(s):
- 218
- ISSN :
- 1530-1877
- E-ISBN :
- 978-0-7695-4433-5
- Print ISBN:
- 978-1-4577-0483-3
- INSPEC Accession Number:
- 12122489
- Conference Location :
- Trondheim
- Digital Object Identifier :
- 10.1109/ETS.2011.49
- Product Type:
- Conference Publications
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