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With a given test set, this paper is concerned about selecting a subset of test patterns and manipulating them into high-quality ones that reduce both under-testing and over-testing, which are both serious concerns for the semiconductor industry with technology scaling. Experimental results on IWLS'05 benchmark demonstrate the effectiveness of the proposed solution.
European Test Symposium (ETS), 2011 16th IEEE
Date of Conference: 23-27 May 2011