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Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

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6 Author(s)
Alves, N. ; Sch. of Eng., Brown Univ., Providence, RI, USA ; Shi, Y. ; Imbriglia, N. ; Dworak, J.
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We propose using logic implications as a source of online diagnostic data for on-chip test set selection by taking advantage of their ability to automatically identify a restricted set of faults as the potential cause of an observed error. This information will be used to dynamically choose a test set to detect systematic latent defects or wear out in a multi core system.

Published in:

European Test Symposium (ETS), 2011 16th IEEE

Date of Conference:

23-27 May 2011