By Topic

Dynamic Test Set Selection Using Implication-Based On-Chip Diagnosis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Alves, N. ; Sch. of Eng., Brown Univ., Providence, RI, USA ; Shi, Y. ; Imbriglia, N. ; Dworak, J.
more authors

We propose using logic implications as a source of online diagnostic data for on-chip test set selection by taking advantage of their ability to automatically identify a restricted set of faults as the potential cause of an observed error. This information will be used to dynamically choose a test set to detect systematic latent defects or wear out in a multi core system.

Published in:

Test Symposium (ETS), 2011 16th IEEE European

Date of Conference:

23-27 May 2011