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Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

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9 Author(s)
Rode, S. ; Institut für Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universität Mainz, Jakob-Welder-Weg 11, 55099 Mainz, Germany ; Stark, R. ; Lubbe, J. ; Troger, L.
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A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100

to around 10
after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 7 )

Date of Publication:

Jul 2011

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