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Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment

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9 Author(s)
Rode, S. ; Institut für Physikalische Chemie, Fachbereich Chemie, Johannes Gutenberg-Universität Mainz, Jakob-Welder-Weg 11, 55099 Mainz, Germany ; Stark, R. ; Lubbe, J. ; Troger, L.
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3606399 

A key issue for high-resolution frequency-modulation atomic force microscopy imaging in liquids is minimizing the frequency noise, which requires a detailed analysis of the corresponding noise contributions. In this paper, we present a detailed description for modifying a commercial atomic force microscope (Bruker MultiMode V with Nanoscope V controller), aiming at atomic-resolution frequency-modulation imaging in ambient and in liquid environment. Care was taken to maintain the AFMs original stability and ease of operation. The new system builds upon an optimized light source, a new photodiode and an entirely new amplifier. Moreover, we introduce a home-built liquid cell and sample holder as well as a temperature-stabilized isolation chamber dedicated to low-noise imaging in liquids. The success of these modifications is measured by the reduction in the deflection sensor noise density from initially 100

fm/
 Hz
to around 10
fm/
 Hz
after modification. The performance of our instrument is demonstrated by atomically resolved images of calcite taken under liquid conditions.

Published in:

Review of Scientific Instruments  (Volume:82 ,  Issue: 7 )

Date of Publication:

Jul 2011

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