By Topic

Probing quantum dot cores, their interfaces and thiol cappings non-destructively in dilute solution using Raman scattering in hollow core photonic crystal fiber

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Mak, J.S.W. ; Edward S. Rogers Sr. Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada ; Farah, A.A. ; Chen, F. ; Helmy, A.S.

Efficient Raman scattering of thiol-capped CdTe quantum dot solutions were obtained using HC-PCF. Strong Raman modes of the CdTe core, thiol agents, and their interfacial compound were observed and compared for the first time.

Published in:

Lasers and Electro-Optics (CLEO), 2011 Conference on

Date of Conference:

1-6 May 2011