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Microcontroller testing using on-load-board DAC

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3 Author(s)
Demidenko, S. ; RMIT Univ. Saigon South Campus, Vietnam ; Mohtar, A.Z. ; Lee, K.H.

Microcontroller devices mass-produced by the industry often include built-in mixed-signal analog-to-digital conversion circuitry. Testing of these converters embedded into an otherwise purely digital integrated circuit requires using additional equipment, extends test time, and ultimately leads to higher cost. A traditional test set-up would include Automatic Test Equipment (ATE) system as well as an external rack-and-stack device for analog-to-digital and digital-to-analog converter testing. This paper proposes to substitute this external device with a simple electronic circuitry placed on the ATE load-board.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE

Date of Conference:

10-12 May 2011