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New complex permittivity measurement method at low frequency for measuring low-loss materials using high Q-value LC resonator immersed in liquid nitrogen

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4 Author(s)
Hirosuke Suzuki ; Development and Technical Division, Keycom Corp, Tokyo 170-0005, Japan ; Tsutomu Kobayashi ; Hidetoshi Takino ; Toshio Nojima

This paper presents a method for measuring the complex permittivity (relative dielectric constant ε'r and dielectric loss tangent tan δ) of sheet materials in the 1-15 MHz range, as part of efforts to achieve low dielectric loss. We were able to measure tan δ of 2×10-4 at low frequency by employing the following procedure. (1) The coil is immersed in liquid nitrogen, LN2. (2) Coupling of the resonating coil to the input-output coil is decreased to less than -30 dB. (3) A network analyzer is used to measure frequency and Q value. (4) Low-loss material is used as the standard to calibrate the capacitance of the measurement circuit. (5) A Litz wire coil is used to measure permittivity.

Published in:

Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE

Date of Conference:

10-12 May 2011